Advances in Imaging and Electron Physics merges two long-running serials–Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles onthe physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
[pdf] Peter W. Hawkes, Benjamin Kazan and Tom Mulvey (Eds.)
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Category: Physics
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